Welcome to FIBsuperprobes

Our vision is to enable a new era in scanning probe microscopy (SPM), in which nanometer-scale sensing devices – specifically superconducting devices – can be directly patterned on-tip and used to reveal new types of contrast. To realize this vision, we will use focused ion beam (FIB) techniques to produce sensors with unprecedented size, functionality, and sensitivity directly on the tips of custom-designed cantilevers. The key to this undertaking will be the unique capability of FIB to mill, grow, or structurally modify materials – especially superconductors – at the nanometer-scale and on non-planar surfaces. The resulting imaging techniques will significantly surpass state-of-the-art SPM and help us to unravel poorly understood phenomena in physics, chemistry, and material science, which are impossible to address with today’s technology. 

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This project has received funding from the European Union's Horizon 2020 research and innovation programme under grant agreement No 892427.